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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
AFM has also been used to measure, in an aqueous environment, the dispersion force due to polymer adsorbed on the substrate. [17] Forces of the order of a few piconewtons can now be routinely measured with a vertical distance resolution of better than 0.1 nanometers. Force spectroscopy can be performed with either static or dynamic modes.
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
The part that grates most for scientists is that their supervisors garnered hefty pay increases of 18% to 43% in 2014 after the union waged a court battle on their behalf, arguing that the state ...
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California’s economy is regarded as fairly healthy, but in some ways it still lags the nation. Unemployment last month was 5.3%, tied for the nation’s second highest behind Nevada. The ...
Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.
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