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In telecommunications and transmission line theory, the reflection coefficient is the ratio of the complex amplitude of the reflected wave to that of the incident wave. The voltage and current at any point along a transmission line can always be resolved into forward and reflected traveling waves given a specified reference impedance Z 0.
Thinfilm is a web interface that implements the transfer-matrix method, outputting reflection and transmission coefficients, and also ellipsometric parameters Psi and Delta. Luxpop.com is another web interface that implements the transfer-matrix method.
To the left of the critical angle is the region of partial reflection; here both reflection coefficients are real (phase 0° or 180°) with magnitudes less than 1. To the right of the critical angle is the region of total reflection; there both reflection coefficients are complex with magnitudes equal to 1.
We call the fraction of the incident power that is reflected from the interface the reflectance (or reflectivity, or power reflection coefficient) R, and the fraction that is refracted into the second medium is called the transmittance (or transmissivity, or power transmission coefficient) T.
Vice versa is true when reflection occurs at lower refractive index interface.) [4] Also, this is referring to near-normal incidence—for p-polarized light reflecting off glass at glancing angle, beyond the Brewster angle, the phase change is 0°. The phase changes that take place upon reflection play an important part in thin film interference.
In radio frequency (RF) practice this is often measured in a dimensionless ratio known as voltage standing wave ratio (VSWR) with a VSWR bridge. The ratio of energy bounced back depends on the impedance mismatch. Mathematically, it is defined using the reflection coefficient. [2]
Reflectivity is the square of the magnitude of the Fresnel reflection coefficient, [4] which is the ratio of the reflected to incident electric field; [5] as such the reflection coefficient can be expressed as a complex number as determined by the Fresnel equations for a single layer, whereas the reflectance is always a positive real number.
In microfacet models it is assumed that there is always a perfect reflection, but the normal changes according to a certain distribution, resulting in a non-perfect overall reflection. When using Schlick’s approximation, the normal in the above computation is replaced by the halfway vector .