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A change in the force applied to a cantilever can shift the resonance frequency. The frequency shift can be measured with exquisite accuracy using heterodyne techniques and is the basis of ac-coupled cantilever sensors. The principal advantage of MEMS cantilevers is their cheapness and ease of fabrication in large arrays.
Diagrams showing the effect of cantilever movement with the photodetector represented by the square with quadrants labelled A, B, C and D. Torsional bending of the cantilever (left) leads to a change in lateral deflection and (right) vertical displacement of the cantilever leads to a change in vertical deflection
The qplus sensor-based cantilevers are much stiffer than regular silicon cantilevers, allowing stable operation in the negative force regime without instabilities. [33] An added benefit of the stiff cantilever is the possibility to measure STM tunneling current while performing the AFM experiment, thus providing complementary data for the AFM ...
Schemes for dynamic mode operation include frequency modulation where a phase-locked loop is used to track the cantilever's resonance frequency and the more common amplitude modulation with a servo loop in place to keep the cantilever excitation to a defined amplitude. In frequency modulation, changes in the oscillation frequency provide ...
The cantilever in the AFM is a reference electrode that forms a capacitor with the surface, over which it is scanned laterally at a constant separation. The cantilever is not piezoelectrically driven at its mechanical resonance frequency ω 0 as in normal AFM although an alternating current (AC) voltage is applied at this frequency.
The prior art includes an RF MEMS frequency tunable fractal antenna for the 0.1–6 GHz frequency range, [18] and the actual integration of RF MEMS switches on a self-similar Sierpinski gasket antenna to increase its number of resonant frequencies, extending its range to 8 GHz, 14 GHz and 25 GHz, [19] [20] an RF MEMS radiation pattern ...
In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime. In this non-contact regime, the electric force gradient causes a shift in the resonance frequency of the cantilever.
MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...