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  2. Radio-frequency microelectromechanical system - Wikipedia

    en.wikipedia.org/wiki/Radio-frequency_micro...

    The prior art includes an RF MEMS frequency tunable fractal antenna for the 0.1–6 GHz frequency range, [18] and the actual integration of RF MEMS switches on a self-similar Sierpinski gasket antenna to increase its number of resonant frequencies, extending its range to 8 GHz, 14 GHz and 25 GHz, [19] [20] an RF MEMS radiation pattern ...

  3. Cantilever - Wikipedia

    en.wikipedia.org/wiki/Cantilever

    A change in the force applied to a cantilever can shift the resonance frequency. The frequency shift can be measured with exquisite accuracy using heterodyne techniques and is the basis of ac-coupled cantilever sensors. The principal advantage of MEMS cantilevers is their cheapness and ease of fabrication in large arrays.

  4. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    Diagrams showing the effect of cantilever movement with the photodetector represented by the square with quadrants labelled A, B, C and D. Torsional bending of the cantilever (left) leads to a change in lateral deflection and (right) vertical displacement of the cantilever leads to a change in vertical deflection

  5. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    The cantilever in the AFM is a reference electrode that forms a capacitor with the surface, over which it is scanned laterally at a constant separation. The cantilever is not piezoelectrically driven at its mechanical resonance frequency ω 0 as in normal AFM although an alternating current (AC) voltage is applied at this frequency.

  6. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    The qplus sensor-based cantilevers are much stiffer than regular silicon cantilevers, allowing stable operation in the negative force regime without instabilities. [33] An added benefit of the stiff cantilever is the possibility to measure STM tunneling current while performing the AFM experiment, thus providing complementary data for the AFM ...

  7. Electrostatic force microscope - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_force_microscope

    In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime. In this non-contact regime, the electric force gradient causes a shift in the resonance frequency of the cantilever.

  8. Chemical sensor array - Wikipedia

    en.wikipedia.org/wiki/Chemical_sensor_array

    A chemical sensor array is a sensor architecture with multiple sensor components that create a pattern for analyte detection from the additive responses of individual sensor components. There exist several types of chemical sensor arrays including electronic, optical, acoustic wave, and potentiometric devices.

  9. MEMS - Wikipedia

    en.wikipedia.org/wiki/MEMS

    MEMS microcantilever resonating inside a scanning electron microscope Proposal submitted to DARPA in 1986 first introducing the term "microelectromechanical systems". MEMS (micro-electromechanical systems) is the technology of microscopic devices incorporating both electronic and moving parts.