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  2. Automatic item generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_Item_Generation

    Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...

  3. FAN algorithm - Wikipedia

    en.wikipedia.org/wiki/FAN_algorithm

    FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.

  4. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  5. Classification Tree Method - Wikipedia

    en.wikipedia.org/wiki/Classification_Tree_Method

    Tool support: The tool presented by Ostrand and Balcer only supported test case generation, but not the partitioning itself. Grochtmann and Wegener presented their tool, the Classification Tree Editor (CTE) which supports both partitioning as well as test case generation.

  6. Test automation - Wikipedia

    en.wikipedia.org/wiki/Test_automation

    There are many approaches to test automation, however below are the general approaches used widely: Graphical user interface testing.A testing framework that generates user interface events such as keystrokes and mouse clicks, and observes the changes that result in the user interface, to validate that the observable behavior of the program is correct.

  7. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  8. Universal Test Specification Language - Wikipedia

    en.wikipedia.org/wiki/Universal_Test...

    Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.

  9. Model-based testing - Wikipedia

    en.wikipedia.org/wiki/Model-based_testing

    Offline generation of executable tests means that a model-based testing tool generates test cases as computer-readable assets that can be later run automatically; for example, a collection of Python classes that embodies the generated testing logic. Offline generation of manually deployable tests means that a model-based testing tool generates ...

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