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  2. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    These signals are combined in the amplifier circuit to yield a wide band signal extending from DC to over 50 MHz. (Wedlock & Roberge 1969, p. 154) The Tektronix A6302 current probe and AM503 amplifier combination is an example of such a system

  3. Tektronix - Wikipedia

    en.wikipedia.org/wiki/Tektronix

    In 1956, a large property in Beaverton became available, and the company's employee retirement trust purchased the land and leased it back to the company. [10] Construction began in 1957 and on May 1, 1959, Tektronix moved into its new Beaverton headquarters campus, [10] on a 313-acre (1.27 km 2) site which came to be called the Tektronix Industrial Park.

  4. Standard Commands for Programmable Instruments - Wikipedia

    en.wikipedia.org/wiki/Standard_Commands_for...

    Tektronix DMM6500, 1202 page PDF file. Oscilloscopes. Keysight InfiniiVision Families, 1896 page PDF file. Rohde-Schwarz MXO 4 Series, 848 page PDF file. Tektronix MSO 4/5/6 Families, 2050 page PDF file.

  5. Tektronix analog oscilloscopes - Wikipedia

    en.wikipedia.org/wiki/Tektronix_Analog_Oscilloscopes

    A Tektronix 465 portable analog oscilloscope is a typical instrument of the late 1970s. In the 1960s Tektronix introduced the relatively compact 450 series of portable oscilloscopes, starting with the 50 MHz 453. The 453 was superseded by the 454. There was also a 422 15 MHz AC/DC portable made. [1]

  6. Current clamp - Wikipedia

    en.wikipedia.org/wiki/Current_clamp

    In electrical and electronic engineering, a current clamp, also known as current probe, is an electrical device with jaws which open to allow clamping around an electrical conductor. This allows measurement of the current in a conductor without the need to make physical contact with it, or to disconnect it for insertion through the probe.

  7. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.

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