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  2. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  3. Full width at half maximum - Wikipedia

    en.wikipedia.org/wiki/Full_width_at_half_maximum

    Full width at half maximum. In a distribution, full width at half maximum (FWHM) is the difference between the two values of the independent variable at which the dependent variable is equal to half of its maximum value. In other words, it is the width of a spectrum curve measured between those points on the y-axis which are half the maximum ...

  4. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

  5. X-ray crystal truncation rod - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystal_truncation_rod

    X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal , the diffracted pattern is concentrated in Dirac delta function like Bragg peaks .

  6. LibreOffice Calc - Wikipedia

    en.wikipedia.org/wiki/LibreOffice_Calc

    LibreOffice Calc is the spreadsheet component of the LibreOffice software package. [6] [7]After forking from OpenOffice.org in 2010, LibreOffice Calc underwent a massive re-work of external reference handling to fix many defects in formula calculations involving external references, and to boost data caching performance, especially when referencing large data ranges.

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  8. Numeric precision in Microsoft Excel - Wikipedia

    en.wikipedia.org/wiki/Numeric_precision_in...

    Excel maintains 15 figures in its numbers, but they are not always accurate; mathematically, the bottom line should be the same as the top line, in 'fp-math' the step '1 + 1/9000' leads to a rounding up as the first bit of the 14 bit tail '10111000110010' of the mantissa falling off the table when adding 1 is a '1', this up-rounding is not undone when subtracting the 1 again, since there is no ...

  9. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.