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High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...
Stress testing. Stress testing is a form of deliberately intense or thorough testing, used to determine the stability of a given system, critical infrastructure or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Reasons can include: to determine breaking points or safe ...
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Reasons can include: to determine breaking points and ...
Prime95, also distributed as the command-line utility mprime for FreeBSD and Linux, is a freeware application written by George Woltman. It is the official client of the Great Internet Mersenne Prime Search (GIMPS), a volunteer computing project dedicated to searching for Mersenne primes. It is also used in overclocking to test for system ...
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: or constraints such as: The main purpose [1] of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment.
The purpose of this paper is to provide standardized definitions and a roadmap of test processes for the Environmental Stress Screening (ESS) of replacement and repaired components used on Air Force systems. The term “component” is used interchangeably with the term “unit” and includes Line-replaceable unit (LRU) and sub-units (SRU).
The Intel MCS-51 (commonly termed 8051) is a single chip microcontroller (MCU) series developed by Intel in 1980 for use in embedded systems. The architect of the Intel MCS-51 instruction set was John H. Wharton. [ 1 ][ 2 ] Intel's original versions were popular in the 1980s and early 1990s, and enhanced binary compatible derivatives remain ...
SPECint. SPEC INT is a computer benchmark specification for CPU integer processing power. It is maintained by the Standard Performance Evaluation Corporation (SPEC). SPEC INT is the integer performance testing component of the SPEC test suite. The first SPEC test suite, CPU92, was announced in 1992. It was followed by CPU95, CPU2000, and CPU2006.