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  2. Ion beam analysis - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_analysis

    The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.

  3. Ion beam - Wikipedia

    en.wikipedia.org/wiki/Ion_beam

    An ion beam is a beam of ions, a type of charged particle beam. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. There are many ion beam sources, some derived from the mercury vapor thrusters developed by NASA in the 1960s. The most widely used ion beams are of singly-charged ions.

  4. Ion source - Wikipedia

    en.wikipedia.org/wiki/Ion_source

    Electron capture ionization (ECI) is the ionization of a gas phase atom or molecule by attachment of an electron to create an ion of the form A −•.The reaction is + where the M over the arrow denotes that to conserve energy and momentum a third body is required (the molecularity of the reaction is three).

  5. Ion beam deposition - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_deposition

    Ion beam deposition (IBD) is a process of applying materials to a target through the application of an ion beam. [1] Ion beam deposition setup with mass separator. An ion beam deposition apparatus typically consists of an ion source, ion optics, and the deposition target. Optionally a mass analyzer can be incorporated. [2]

  6. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    As the diagram on the right shows, the gallium (Ga+) primary ion beam hits the sample surface and sputters a small amount of material, which leaves the surface as either secondary ions (i+ or i−) or neutral atoms (n 0). The primary beam also produces secondary electrons (e −). As the primary beam rasters on the sample surface, the signal ...

  7. Thermal ionization - Wikipedia

    en.wikipedia.org/wiki/Thermal_ionization

    Thermal ionization is used to make simple ion sources, for mass spectrometry and for generating ion beams. [1] Thermal ionization has seen extensive use in determining atomic weights, in addition to being used in many geological/nuclear applications. [2]

  8. Fast atom bombardment - Wikipedia

    en.wikipedia.org/wiki/Fast_atom_bombardment

    When a beam of high energy ions is used instead of atoms (as in secondary ion mass spectrometry), the method is known as liquid secondary ion mass spectrometry (LSIMS). [ 5 ] [ 6 ] [ 7 ] In FAB and LSIMS, the material to be analyzed is mixed with a non-volatile chemical protection environment, called a matrix , and is bombarded under vacuum ...

  9. Beam emittance - Wikipedia

    en.wikipedia.org/wiki/Beam_emittance

    In a colliding beam accelerator, keeping the emittance small means that the likelihood of particle interactions will be greater resulting in higher luminosity. [3] In a synchrotron light source, low emittance means that the resulting x-ray beam will be small, and result in higher brightness. [4]

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