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  2. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    The minimum possible value is zero, indicating perfect agreement between experimental observations and the structure factors predicted from the model. There is no theoretical maximum, but in practice, values are considerably less than one even for poor models, provided the model includes a suitable scale factor.

  3. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

  4. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  5. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  7. X-ray scattering techniques - Wikipedia

    en.wikipedia.org/wiki/X-ray_scattering_techniques

    Note that X-ray diffraction is sometimes considered a sub-set of X-ray scattering, where the scattering is elastic and the scattering object is crystalline, so that the resulting pattern contains sharp spots analyzed by X-ray crystallography (as in the Figure).

  8. Flack parameter - Wikipedia

    en.wikipedia.org/wiki/Flack_parameter

    By determining x for all data, x is usually found to be between 0 and 1. If the value is near 0, with a small standard uncertainty, the absolute structure given by the structure refinement is likely correct, and if the value is near 1, then the inverted structure is likely correct. If the value is near 0.5, the crystal may be racemic or twinned ...

  9. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    Laboratory X-ray diffraction equipment relies on the use of an X-ray tube, which is used to produce the X-rays. The most commonly used laboratory X-ray tube uses a copper anode, but cobalt and molybdenum are also popular. The wavelength in nm varies for each source. The table below shows these wavelengths, determined by Bearden [14] (all values ...