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The inelastic mean free path of electrons can roughly be described by a universal curve that is the same for all materials. [ 1 ] [ 3 ] The knowledge of the IMFP is indispensable for several electron spectroscopy and microscopy measurements.
In physics, mean free path is the average distance over which a moving particle (such as an atom, a molecule, or a photon) travels before substantially changing its direction or energy (or, in a specific context, other properties), typically as a result of one or more successive collisions with other particles.
Here mfp is the mean free path of electron inelastic scattering, which has been tabulated for most elemental solids and oxides. [ 14 ] The spatial resolution of this procedure is limited by the plasmon localization and is about 1 nm, [ 6 ] meaning that spatial thickness maps can be measured in scanning transmission electron microscopy with ~1 ...
To describe the Inelastic mean free path of electrons in solids. A universal object for the moduli of curves This page was last edited on 13 ...
The Knudsen number is a dimensionless number defined as =, where = mean free path [L 1], = representative physical length scale [L 1].. The representative length scale considered, , may correspond to various physical traits of a system, but most commonly relates to a gap length over which thermal transport or mass transport occurs through a gas phase.
In nuclear physics, area cross-sections (e.g. σ in barns or units of 10 −24 cm 2), density mean free path (e.g. τ in grams/cm 2), and its reciprocal the mass attenuation coefficient (e.g. in cm 2 /gram) or area per nucleon are all popular, while in electron microscopy the inelastic mean free path [14] (e.g. λ in nanometers) is often ...
Here d is the penetration depth, and () denotes the inelastic mean free path, defined as the distance an electron can travel before its intensity has decreased by the factor 1/e. While the inelastic scattering processes and consequently the electronic mean free path depend on the energy, it is relatively independent of the material.
Secondary electrons are also the main means of viewing images in the scanning electron microscope (SEM). The range of secondary electrons depends on the energy. Plotting the inelastic mean free path as a function of energy often shows characteristics of the "universal curve" [1] familiar to electron spectroscopists and surface analysts.