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  2. Scan chain - Wikipedia

    en.wikipedia.org/wiki/Scan_chain

    The basic structure of scan include the following set of signals in order to control and observe the scan mechanism. Scan_in and scan_out define the input and output of a scan chain. In a full scan mode usually each input drives only one chain and scan out observe one as well. A scan enable pin is a special signal that is added to a design.

  3. JTAG - Wikipedia

    en.wikipedia.org/wiki/JTAG

    JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture.. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. [1]

  4. Boundary scan - Wikipedia

    en.wikipedia.org/wiki/Boundary_scan

    Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit (IC).Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.

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  6. Technetium-99m - Wikipedia

    en.wikipedia.org/wiki/Technetium-99m

    For a bone scan, the patient is injected with a small amount of radioactive material, such as 700–1,100 MBq (19–30 mCi) of 99m Tc-medronic acid and then scanned with a gamma camera. Medronic acid is a phosphate derivative which can exchange places with bone phosphate in regions of active bone growth, so anchoring the radioisotope to that ...

  7. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  8. Convex hull algorithms - Wikipedia

    en.wikipedia.org/wiki/Convex_hull_algorithms

    Monotone chain, a.k.a. Andrew's algorithm — O(n log n) Published in 1979 by A. M. Andrew. The algorithm can be seen as a variant of Graham scan which sorts the points lexicographically by their coordinates. When the input is already sorted, the algorithm takes O(n) time. Incremental convex hull algorithm — O(n log n)

  9. Burroughs B6x00-7x00 instruction set - Wikipedia

    en.wikipedia.org/wiki/Burroughs_B6x00-7x00...

    The Burroughs B6x00-7x00 instruction set includes the set of valid operations for the Burroughs B6500, [1] B7500 and later Burroughs large systems, including the current (as of 2006) Unisys Clearpath/MCP systems; it does not include the instruction for other Burroughs large systems including the B5000, B5500, B5700 and the B8500.