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  2. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).

  3. Continuity test - Wikipedia

    en.wikipedia.org/wiki/Continuity_test

    In electronics, a continuity test is the checking of an electric circuit to see if current flows (that it is in fact a complete circuit). A continuity test is performed by placing a small voltage (wired in series with an LED or noise-producing component such as a piezoelectric speaker ) across the chosen path.

  4. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Continuity tester; a buzzer sounds when a circuit's resistance is low enough (just how low is enough varies from meter to meter), so the test must be treated as inexact. Diodes (measuring forward drop of diode junctions). Transistors (measuring current gain and other parameters in some kinds of transistors)

  5. Load line (electronics) - Wikipedia

    en.wikipedia.org/wiki/Load_line_(electronics)

    The characteristic curve (curved line), representing the current I through the diode for any given voltage across the diode V D, is an exponential curve. The load line (diagonal line) , representing the relationship between current and voltage due to Kirchhoff's voltage law applied to the resistor and voltage source, is

  6. Diode - Wikipedia

    en.wikipedia.org/wiki/Diode

    A diode is a two-terminal electronic component that conducts current primarily in one direction (asymmetric conductance). ... Its hydraulic analogy is a check valve.

  7. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  8. Schottky diode - Wikipedia

    en.wikipedia.org/wiki/Schottky_diode

    The Schottky diode (named after the German physicist Walter H. Schottky), also known as Schottky barrier diode or hot-carrier diode, is a semiconductor diode formed by the junction of a semiconductor with a metal. It has a low forward voltage drop and a very fast switching action.

  9. Shockley diode equation - Wikipedia

    en.wikipedia.org/wiki/Shockley_diode_equation

    Shockley derives an equation for the voltage across a p-n junction in a long article published in 1949. [2] Later he gives a corresponding equation for current as a function of voltage under additional assumptions, which is the equation we call the Shockley ideal diode equation. [3]