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An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
In the very low magnification range of SEM, overlapping the upper magnification of a light microscope, the superior field is limited to a varying degree by the ESEM mode. The degree of this limitation strongly depends on instrument design.
Thin section of quartz from a hydrothermal vein - left in CL and right in transmitted light. In geology, mineralogy, materials science and semiconductor engineering, a scanning electron microscope (SEM) fitted with a cathodoluminescence detector, or an optical cathodoluminescence microscope, may be used to examine internal structures of semiconductors, rocks, ceramics, glass, etc. in order to ...
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...
High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...
This image illustrates well the capabilities of a scanning electron microscope (SEM). This is a magnification series for a snow crystal, from 93x to 36,000x magnification, using a special low-temperature SEM (LT-SEM) to preserve the crystal. - 18:19, 20 Mar 2005 (UTC) Nominate and support either version.
A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens.
Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy .