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Material failure theory is an interdisciplinary field of materials science and solid mechanics which attempts to predict the conditions under which solid materials fail under the action of external loads. The failure of a material is usually classified into brittle failure or ductile failure .
An approach to the design and development of reliable product to prevent failure, based on the knowledge of root cause failure mechanisms. The Physics of Failure (PoF) concept is based on the understanding of the relationships between requirements and the physical characteristics of the product and their variation in the manufacturing processes ...
A PFMEA will focus on process failure modes (such as inserting the wrong drill bit). Failure cause and/or mechanism Defects in requirements, design, process, quality control, handling or part application, which are the underlying cause or sequence of causes that initiate a process (mechanism) that leads to a failure mode over a certain time.
A crack growth equation is used for calculating the size of a fatigue crack growing from cyclic loads. The growth of a fatigue crack can result in catastrophic failure, particularly in the case of aircraft. When many growing fatigue cracks interact with one another it is known as widespread fatigue damage. A crack growth equation can be used to ...
The theory of micro-mechanics of failure aims to explain the failure of continuous fiber reinforced composites by micro-scale analysis of stresses within each constituent material (such as fiber and matrix), and of the stresses at the interfaces between those constituents, calculated from the macro stresses at the ply level.
Under the functional failure mode approach, the actual functional failure modes of the product are identified during a DFMEA. During the detailed FMEDA, each component failure mode is mapped to a functional failure mode. The functional failure modes are then categorized according to product failure mode in a particular application. [13]
Stranski–Krastanov growth (SK growth, also Stransky–Krastanov or 'Stranski–Krastanow') is one of the three primary modes by which thin films grow epitaxially at a crystal surface or interface. Also known as 'layer-plus-island growth', the SK mode follows a two step process: initially, complete films of adsorbates , up to several ...
There are different breakdown models and thickness of the gate oxide determines the validity of the model. E model, 1/E model and power law exponential model are common models which depict the breakdown behavior. The failure types for integrated circuit (IC) components follow the classic bath tub curve. There is infant mortality, which is ...