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  2. First-pass yield - Wikipedia

    en.wikipedia.org/wiki/First-pass_yield

    The total first time yield is equal to FTYofA * FTYofB * FTYofC * FTYofD or 0.9000 * 0.8889 * 0.9375 * 0.9333 = 0.7000. You can also get the total process yield for the entire process by simply dividing the number of good units produced by the number going into the start of the process. In this case, 70/100 = 0.70 or 70% yield.

  3. Design for manufacturability - Wikipedia

    en.wikipedia.org/wiki/Design_for_manufacturability

    Semiconductor Design for Manufacturing (DFM) Semiconductor Design for Manufacturing (DFM) is a comprehensive set of principles and techniques used in integrated circuit (IC) design to ensure that those designs transition smoothly into high-volume manufacturing with optimal yield and reliability. DFM focuses on anticipating potential fabrication ...

  4. Semiconductor device fabrication - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_device...

    The yield is often but not necessarily related to device (die or chip) size. As an example, in December 2019, TSMC announced an average yield of ~80%, with a peak yield per wafer of >90% for their 5nm test chips with a die size of 17.92 mm 2. The yield went down to 32% with an increase in die size to 100 mm 2. [189]

  5. Process capability index - Wikipedia

    en.wikipedia.org/wiki/Process_capability_index

    For example, in the automotive industry, the Automotive Industry Action Group sets forth guidelines in the Production Part Approval Process, 4th edition for recommended C pk minimum values for critical-to-quality process characteristics. However, these criteria are debatable and several processes may not be evaluated for capability just because ...

  6. Yield (engineering) - Wikipedia

    en.wikipedia.org/wiki/Yield_(engineering)

    The yield strength or yield stress is a material property and is the stress corresponding to the yield point at which the material begins to deform plastically. The yield strength is often used to determine the maximum allowable load in a mechanical component, since it represents the upper limit to forces that can be applied without producing ...

  7. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  8. Manufacturing readiness level - Wikipedia

    en.wikipedia.org/wiki/Manufacturing_readiness_level

    The manufacturing readiness level (MRL) is a measure to assess the maturity of manufacturing readiness, similar to how technology readiness levels (TRL) are used for technology readiness. They can be used in general industry assessments, [ 1 ] or for more specific application in assessing capabilities of possible suppliers.

  9. Manufacturing engineering - Wikipedia

    en.wikipedia.org/wiki/Manufacturing_engineering

    Manufacturing engineers develop and create physical artifacts, production processes, and technology. It is a very broad area which includes the design and development of products. Manufacturing engineering is considered to be a subdiscipline of industrial engineering/systems engineering and has very strong overlaps with mechanical engineering ...