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Citation analysis is the examination of the frequency, patterns, and graphs of citations in documents. It uses the directed graph of citations — links from one document to another document — to reveal properties of the documents. A typical aim would be to identify the most important documents in a collection.
Citation analysis is the examination of the frequency, patterns, and graphs of citations in documents. It uses the directed graph of citations — links from one document to another document — to reveal properties of the documents. A typical aim would be to identify the most important documents in a collection.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.
Crystallographers also use the Free R-Factor [3] to assess possible overmodeling of the data. R F r e e {\displaystyle R_{Free}} is computed according to the same formula given above, but on a small, random sample of data that are set aside for the purpose and never included in the refinement.
This page in a nutshell: Cite reliable sources.You can add a citation by selecting from the drop-down menu at the top of the editing box.In markup, you can add a citation manually using ref tags.
Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [ 3 ] X-ray standing waves , another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry.
X-ray filters are also used for X-ray diffraction, in determinations of the interatomic spaces of crystalline solids. These lattice spacings can be determined using Bragg diffraction, but this technique requires scans to be done with approximately monochromatic X-ray beams. Thus, filter set ups like the copper nickel system described above are ...
The PDF contains more than a million unique material data sets. Each data set contains diffraction, crystallographic and bibliographic data, as well as experimental, instrument and sampling conditions, and select physical properties in a common standardized format.
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