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The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.
Free-electron lasers have been developed for use in X-ray diffraction and crystallography. [27] These are the brightest X-ray sources currently available; with the X-rays coming in femtosecond bursts. The intensity of the source is such that atomic resolution diffraction patterns can be resolved for crystals otherwise too small for collection.
Laue equation. In crystallography and solid state physics, the Laue equations relate incoming waves to outgoing waves in the process of elastic scattering, where the photon energy or light temporal frequency does not change upon scattering by a crystal lattice. They are named after physicist Max von Laue (1879–1960).
This equation, Bragg's law, describes the condition on θ for constructive interference. [12] A map of the intensities of the scattered waves as a function of their angle is called a diffraction pattern. Strong intensities known as Bragg peaks are obtained in the diffraction pattern when the scattering angles satisfy Bragg condition.
In X-ray crystallography, wide-angle X-ray scattering (WAXS) or wide-angle X-ray diffraction (WAXD) is the analysis of Bragg peaks scattered to wide angles, which (by Bragg's law) are caused by sub-nanometer-sized structures. [1] It is an X-ray-diffraction [2] method
The method was first implemented in 1967, [1] and reported in 1969 [2] for the diffraction of monochromatic neutrons where the reflection-position is reported in terms of the Bragg angle, 2θ. This terminology will be used here although the technique is equally applicable to alternative scales such as x-ray energy or neutron time-of-flight.
The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...