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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
X-ray optics is the branch of optics dealing with X-rays, rather than visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction , X-ray crystallography , X-ray fluorescence , small-angle X-ray scattering , X-ray microscopy , X-ray phase-contrast imaging , and X-ray ...
The following other wikis use this file: Usage on bn.wikipedia.org আলোকরশ্মি; Usage on bn.wikibooks.org উইকিশৈশব:ইংরেজি বর্ণমালায় বিজ্ঞান/R
In optics, one usually knows the refractive index n of the medium, which is the ratio of the speed of light in vacuum (c) to the speed of light in the medium. In the analysis of partial reflection and transmission, one is also interested in the electromagnetic wave impedance Z, which is the ratio of the amplitude of E to the amplitude of H.
J. Als-Nielsen, D. McMorrow: Elements of Modern X-ray physics. Wiley, 2001 (chapter 5: diffraction by perfect crystals). André Authier: Dynamical theory of X-ray diffraction. IUCr monographs on crystallography, no. 11. Oxford University Press (1st edition 2001/ 2nd edition 2003). ISBN 0-19-852892-2.
Total external reflection is a phenomenon traditionally involving X-rays, but in principle any type of electromagnetic or other wave, closely related to total internal reflection. Total internal reflection describes the fact that radiation (e.g. visible light) can, at certain angles, be totally reflected from an interface between two media of ...
The Ewald sphere is a geometric construction used in electron, neutron, and x-ray diffraction which shows the relationship between: the wavevector of the incident and diffracted beams, the diffraction angle for a given reflection, the reciprocal lattice of the crystal. It was conceived by Paul Peter Ewald, a German physicist and ...