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Formfactor, Inc. is a provider of test and measurement technologies for integrated circuits, with its headquarters in Livermore, California. It provides semiconductor companies with products to improve device performance and provide test and measurement technologies for integrated circuits.
As a trusted supplier, FormFactor provides SK hynix with advanced wafer probe cards for high-bandwidth memory (HBM) testing, high-throughput one-touchdown DRAM testing, and engineering probe systems designed for extreme environments, all of which play a key role in supporting the development of next-generation semiconductor devices.
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Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.
The company announced it was sold to FormFactor, Inc. in February 2016 for $352 million, with the deal closing in June 2016. [29] [30] In 2017, Cascade Microtech, together with Imec, developed a fully-automatic system to pre-bond test advanced 3D chips. The two companies won the 2017 National Instruments Engineering Impact Award in the ...
An EMF meter is a scientific instrument for measuring electromagnetic fields (abbreviated as EMF). Most meters measure the electromagnetic radiation flux density (DC fields) or the change in an electromagnetic field over time (AC fields), essentially the same as a radio antenna, but with quite different detection characteristics.
Corrosion monitoring is the use of a corrator (corrosion meter) or set of methods [1] and equipment to provide offline or online information about corrosion rate expressed in mpy (mill per year). [ 2 ] - for better care and to take or improve preventive measures to combat and protect against corrosion .
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes.