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XPEEM – X-ray photoelectron emission microscopy; XPS – X-ray photoelectron spectroscopy; XRD – X-ray diffraction; XRES – X-ray resonant exchange scattering; XRF – X-ray fluorescence analysis; XRR – X-ray reflectivity; XRS – X-ray Raman scattering; XRT – X-ray transmission; XSW – X-ray standing wave technique
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
It is a sponsor of the Denver X-ray Conference and the Pharmaceutical Powder X-ray Diffraction Symposium. It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD.
First X-ray diffraction view of Martian soil - CheMin analysis reveals feldspar, pyroxenes, olivine and more (Curiosity rover at "Rocknest", October 17, 2012). [6] X-ray powder diffraction of Y 2 Cu 2 O 5 and Rietveld refinement with two phases, showing 1% of yttrium oxide impurity (red tickers) X-ray diffraction (XRD) Small-angle X-ray ...
X-ray crystallography is still the primary method for characterizing the atomic structure of materials and in differentiating materials that appear similar in other experiments. X-ray crystal structures can also help explain unusual electronic or elastic properties of a material, shed light on chemical interactions and processes, or serve as ...
X-ray diffraction, sometimes called Wide-angle X-ray diffraction (WAXD) Small-angle X-ray scattering (SAXS) probes structure in the nanometer to micrometer range by measuring scattering intensity at scattering angles 2θ close to 0°. X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer ...
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a spectrum in which the peaks correspond to specific x-ray lines and elements can be easily ...
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