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A logic probe is a low-cost hand-held test probe used for analyzing and troubleshooting the logical states (boolean 0 or 1) of a digital circuit. When many signals need to be observed or recorded simultaneously, a logic analyzer is used instead.
Logic analyzer. A logic analyzer is an electronic instrument that captures and displays multiple logic signals from a digital system or digital circuit. A logic analyzer may convert the captured data into timing diagrams, protocol decodes, state machine traces, opcodes, or may correlate opcodes with source-level software. Logic analyzers have ...
Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
Keysight commercial digital voltmeter checking a prototype. The following items are used for basic measurement of voltages, currents, and components in the circuit under test. Voltmeter (Measures voltage) Ohmmeter (Measures resistance) Ammeter, e.g. Galvanometer or Milliammeter (Measures current)
Test bench; Test light; Test loop translator; Test probe; Time base generator; Time-domain reflectometer; Total harmonic distortion analyzer; Transformer ratio arm bridge; Transistor tester; Tube tester; Two-tone testing
A universal logic probe. Flying probes are test probes used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s and can be found in many manufacturing and assembly operations, most often in manufacturing of electronic printed circuit boards.
At that time, most test instruments, such as the oscilloscope and logic analyzers in design, and in-circuit test (ICT) in volume manufacturing were external to the chips and circuit boards. They relied upon placing a probe on a chip or a circuit board to obtain test data.
Depending on the DFT choices made during circuit design/implementation, the generation of Structural tests for complex logic circuits can be more or less automated or self-automated [1] Archived 2013-10-13 at the Wayback Machine. One key objective of DFT methodologies, hence, is to allow designers to make trade-offs between the amount and type ...
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