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An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
There are several types of X-ray diffractometer, depending on the research field (material sciences, powder diffraction, life sciences, structural biology, etc.) and the experimental environment, if it is a laboratory with its home X-ray source or a Synchrotron. In laboratory, diffractometers are usually an "all in one" equipment, including the ...
Data exchange among crystallographic databases, structure visualization software, and structure refinement programs has been facilitated by the emergence of the Crystallographic Information File (CIF) format. The CIF format is the standard file format for the exchange and archiving of crystallographic data. [1] It was adopted by the ...
It is most often used to identify substances based on x-ray diffraction data, and is designed for use with a diffractometer. The PDF contains more than a million unique material data sets. The PDF contains more than a million unique material data sets.
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
To measure the intensity along a CTR, the sample must be rotated in the X-ray beam so that the origin of the Ewald sphere is translated and the sphere intersects the rod at a different location in reciprocal space. Performing a rodscan in this way requires accurate coordinated motion of the sample and the detector along different axes.
This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.