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The problem has become more acute as transistors have shrunk, as there is less averaging of the effect over a large gate area. Thus, different transistors experience different amounts of NBTI, defeating standard circuit design techniques for tolerating manufacturing variability which depend on the close matching of adjacent transistors.
This problem arises from small differences in the individual responsitivity of the sensor array (including any local postamplification stages) that might be caused by variations in the pixel size, material or interference with the local circuitry. It might be affected by changes in the environment like different temperatures, exposure times, etc.
This is because CMOS may experience a failure mode known as a stuck-open fault, which cannot be reliably detected with one test vector and requires that two vectors be applied sequentially. The model also fails to detect bridging faults between adjacent signal lines, occurring in pins that drive bus connections and array structures.
A bright dot defect or hot pixel is a group of three sub-pixels (one pixel) all of whose transistors are "off" for TN panels or stuck "on" for MVA and PVA panels. [2] This allows all light to pass through to the RGB layer, creating a bright pixel that is always on.
In electronics, a latch-up is a type of short circuit which can occur in an integrated circuit (IC). More specifically, it is the inadvertent creation of a low-impedance path between the power supply rails of a MOSFET circuit, triggering a parasitic structure which disrupts proper functioning of the part, possibly even leading to its destruction due to overcurrent.
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Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values).
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