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Established in 1991 and originally published by Wiley, it was transferred to its subsidiary Hindawi in 2023, adopting an open access model. The journal was previously known as International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering until 1998. [1] [2]
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SCANNING: The Journal of Scanning Microscopies is a peer-reviewed scientific journal covering all aspects of scanning microscopy, including scanning electron, scanning probe and scanning optical microscopies. [1]
It was established in 1978 by Lokenath Debnath and is published by the Hindawi Publishing Corporation. The journal publishes articles in all areas of mathematics such as pure and applied mathematics, mathematical physics, theoretical mechanics, probability and mathematical statistics, and theoretical biology.
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