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The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
[3] p. 6 In the case where the material is in a heap, scoop or thief sampling needs to be done, which is inaccurate: the sample should ideally have been taken while the powder was flowing towards the heap. [3] p. 10 After sampling, the sample volume typically needs to be reduced.
Plant cellulose, which makes up the cell walls of most plants, is a tough, mesh-like bulkwork in which cellulose fibrils are the primary architectural elements. While bacterial cellulose has the same molecular formula as plant cellulose, it has significantly different macromolecular properties and characteristics. [ 8 ]
Critical radius is the minimum particle size from which an aggregate is thermodynamically stable. In other words, it is the lowest radius formed by atoms or molecules clustering together (in a gas, liquid or solid matrix) before a new phase inclusion (a bubble, a droplet or a solid particle) is viable and begins to grow.
Model of the Mycobacterium spp. cell envelope with 3-D protein structures. Mycobacteria are aerobic with 0.2-0.6 μm wide and 1.0-10 μm long rod shapes. They are generally non-motile, except for the species Mycobacterium marinum, which has been shown to be motile within macrophages. [8] Mycobacteria possess capsules and most do not form ...
Cell expansion begins with the selective loosening of the cell wall, reducing the plant cell's turgor pressure and water potential. This allows for the influx of water, leading to cell enlargement. [3] This enlargement is made possible by the sliding of polymers, increasing the cell wall's surface area. In most plants, cell expansion is ...
Each of the formulas listed in the tables assumes that the roughness profile has been filtered from the raw profile data and the mean line has been calculated. The roughness profile contains n {\displaystyle n} ordered, equally spaced points along the trace, and y i {\displaystyle y_{i}} is the vertical distance from the mean line to the i th ...
This is because when the grain size decreases at nm scale, there is an increase in the density of grain boundary junctions which serves as a source of crack growth or weak bonding. However, it was also observed that at grain size below 3.1 nm, a pseudo Hall–Petch relationship was observed, which results an increase in strength.