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The challenge of characterizing thin films involves extracting t, n(λ) and k(λ) of the film from the measurement of R(λ) and/or T(λ). This can be achieved by combining the Forouhi–Bloomer dispersion equations for n ( λ ) and k ( λ ) with the Fresnel equations for the reflection and transmission of light at an interface [ 21 ] to obtain ...
FreeSnell is a stand-alone computer program that implements the transfer-matrix method, including more advanced aspects such as granular films. Thinfilm is a web interface that implements the transfer-matrix method, outputting reflection and transmission coefficients, and also ellipsometric parameters Psi and Delta.
The heat transfer coefficient is often calculated from the Nusselt number (a dimensionless number). There are also online calculators available specifically for Heat-transfer fluid applications. Experimental assessment of the heat transfer coefficient poses some challenges especially when small fluxes are to be measured (e.g. < 0.2 W/cm 2). [1] [2]
An example of interference between reflections is the iridescent colours seen in a soap bubble or in thin oil films on water. Applications include Fabry–Pérot interferometers, antireflection coatings, and optical filters. A quantitative analysis of these effects is based on the Fresnel equations, but with additional calculations to account ...
Compared to traditional porosimeters, Ellipsometer porosimeters are well suited to very thin film pore size and pore size distribution measurement. Film porosity is a key factor in silicon based technology using low-κ materials, organic industry (encapsulated organic light-emitting diodes ) as well as in the coating industry using sol gel ...
where n is the refractive index, λ is the wavelength, A, B, C, etc., are coefficients that can be determined for a material by fitting the equation to measured refractive indices at known wavelengths. The coefficients are usually quoted for λ as the vacuum wavelength in micrometres. Usually, it is sufficient to use a two-term form of the ...
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
There are two separate causes of optical effects due to coatings, often called thick-film and thin-film effects. Thick-film effects arise because of the difference in the index of refraction between the layers above and below the coating (or film); in the simplest case, these three layers are the air, the coating, and the glass. Thick-film ...