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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
It is valid whenever the radiation field is isotropic over distances comparable to or less than a radiation mean free path, such as in local thermal equilibrium. In practice, the mean opacity for Thomson electron scattering is: κ e s = 0.20 ( 1 + X ) c m 2 g − 1 {\displaystyle \kappa _{\rm {es}}=0.20(1+X)\,\mathrm {cm^{2}\,g^{-1}} } where X ...
X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring.
A Bernal chart (bər′nal ′chärt) in crystallography, is a chart used for indexing X-ray diffraction photographs from single crystals. From such a chart may be read the axial and radial cylindrical coordinates of that point in reciprocal space which corresponds to any particular X-ray reflection.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.
Just open AOL Shield Pro and click the browser menu button (three horizontal lines) in the top right hand corner of the window. Next, scroll down to Bookmarks and then click Import bookmarks and ...
XES – X-ray emission spectroscopy; XPEEM – X-ray photoelectron emission microscopy; XPS – X-ray photoelectron spectroscopy; XRD – X-ray diffraction; XRES – X-ray resonant exchange scattering; XRF – X-ray fluorescence analysis; XRR – X-ray reflectivity; XRS – X-ray Raman scattering; XRT – X-ray transmission; XSW – X-ray ...