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  2. Semiconductor device fabrication - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_device...

    The steps involving testing and packaging of dies, followed by final testing of finished, packaged chips, are called the back end, [118] post-fab, [192] ATMP (Assembly, Test, Marking, and Packaging) [193] or ATP (Assembly, Test and Packaging) of semiconductor manufacturing, and may be carried out by OSAT (OutSourced Assembly and Test) companies ...

  3. Back end of line - Wikipedia

    en.wikipedia.org/wiki/Back_end_of_line

    The BEOL process deposits metalization layers on the silicion to interconnect the individual devices generated during FEOL (bottom). CMOS fabrication process. Back end of the line or back end of line (BEOL) is a process in semiconductor device fabrication that consists of depositing metal interconnect layers onto a wafer already patterned with devices.

  4. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  5. Signoff (electronic design automation) - Wikipedia

    en.wikipedia.org/wiki/Signoff_(electronic_design...

    In the automated design of integrated circuits, signoff (also written as sign-off) checks is the collective name given to a series of verification steps that the design must pass before it can be taped out. This implies an iterative process involving incremental fixes across the board using one or more check types, and then retesting the design.

  6. System integration testing - Wikipedia

    en.wikipedia.org/wiki/System_integration_testing

    A process should exist to exchange data imports and exports between the two data layers. This data exchange process should keep both systems up-to-date. The purpose of system integration testing is to ensure all parts of these systems successfully co-exist and exchange data where necessary. [citation needed]

  7. Post-silicon validation - Wikipedia

    en.wikipedia.org/wiki/Post-silicon_validation

    During the pre-silicon process, engineers test devices in a virtual environment with sophisticated simulation, emulation, and formal verification tools. In contrast, post-silicon validation tests occur on actual devices running at-speed in commercial, real-world system boards using logic analyzer and assertion-based tools.

  8. Frontend and backend - Wikipedia

    en.wikipedia.org/wiki/Frontend_and_Backend

    In software development, frontend refers to the presentation layer that users interact with, while backend involves the data management and processing behind the scenes. In the client–server model , the client is usually considered the frontend, handling user-facing tasks, and the server is the backend, managing data and logic.

  9. Test plan - Wikipedia

    en.wikipedia.org/wiki/Test_plan

    Test coverage in the test plan states what requirements will be verified during what stages of the product life. Test coverage is derived from design specifications and other requirements, such as safety standards or regulatory codes, where each requirement or specification of the design ideally will have one or more corresponding means of verification.