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  2. Design review based on failure mode - Wikipedia

    en.wikipedia.org/wiki/Design_review_based_on...

    Design review based on failure mode (DRBFM) is a tool originally developed by the Toyota Motor Corporation. This tool was developed based on the philosophy that design problems occur when changes are made to existing engineering designs that have already been proven successful.

  3. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits. Failures most commonly occur near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates.

  4. Iddq testing - Wikipedia

    en.wikipedia.org/wiki/Iddq_testing

    Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values).

  5. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    Especially for advanced semiconductor technologies, it is expected some of the chips on each manufactured wafer contain defects that render them non-functional. The primary objective of testing is to find and separate those non-functional chips from the fully functional ones, meaning that one or more responses captured by the tester from a non ...

  6. Automotive electronics - Wikipedia

    en.wikipedia.org/wiki/Automotive_electronics

    The earliest electronic systems available as factory installations were vacuum tube car radios, starting in the early 1930s.The development of semiconductors after World War II greatly expanded the use of electronics in automobiles, with solid-state diodes making the automotive alternator the standard after about 1960, and the first transistorized ignition systems appearing in 1963.

  7. Semiconductor supply chain problems are ‘going to take a long ...

    www.aol.com/finance/semiconductor-supply-chain...

    While the short-term problems will ease, the permanent solution is to “make more semiconductors in America,” Raimondo said. In 1990, the U.S. controlled nearly 40% of the world’s ...

  8. ISO 26262 - Wikipedia

    en.wikipedia.org/wiki/ISO_26262

    ISO 26262, titled "Road vehicles – Functional safety", is an international standard for functional safety of electrical and/or electronic systems that are installed in serial production road vehicles (excluding mopeds), defined by the International Organization for Standardization (ISO) in 2011, and revised in 2018.

  9. Integrated circuit design - Wikipedia

    en.wikipedia.org/wiki/Integrated_circuit_design

    The design of some processors has become complicated enough to be difficult to fully test, and this has caused problems at large cloud providers. [2] In short, the design of an IC using EDA software is the design, test, and verification of the instructions that the IC is to carry out. Artificial Intelligence has been demonstrated in chip design ...