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  2. FormFactor, Inc. - Wikipedia

    en.wikipedia.org/wiki/FormFactor,_Inc.

    Formfactor, Inc. is a provider of test and measurement technologies for integrated circuits, with its headquarters in Livermore, California. It provides semiconductor companies with products to improve device performance and provide test and measurement technologies for integrated circuits.

  3. FormFactor Receives SK hynix Best Partner Award

    lite.aol.com/tech/story/0022/20241118/9275747.htm

    As a trusted supplier, FormFactor provides SK hynix with advanced wafer probe cards for high-bandwidth memory (HBM) testing, high-throughput one-touchdown DRAM testing, and engineering probe systems designed for extreme environments, all of which play a key role in supporting the development of next-generation semiconductor devices.

  4. FormFactor and Advantest Partner on Silicon Photonics Wafer ...

    lite.aol.com/tech/story/0022/20241107/9269784.htm

    Full integration of FormFactor’s Velox™ probe station control and wafer-level measurement with Advantest’s V93000 test system. Wafer-level low-loss edge and surface coupling for photonic devices, with single-click automated calibration using FormFactor’s OptoVue™ and OptoVue™ Pro, enabling the fastest tool setup time.

  5. FormFactor (FORM) Boosts Probe Card Efforts With New Facility

    www.aol.com/news/formfactor-form-boosts-probe...

    FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.

  6. Cascade Microtech - Wikipedia

    en.wikipedia.org/wiki/Cascade_Microtech

    The company announced it was sold to FormFactor, Inc. in February 2016 for $352 million, with the deal closing in June 2016. [29] [30] In 2017, Cascade Microtech, together with Imec, developed a fully-automatic system to pre-bond test advanced 3D chips. The two companies won the 2017 National Instruments Engineering Impact Award in the ...

  7. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.

  8. Why FormFactor Stock Fell 15.9% in April - AOL

    www.aol.com/news/why-formfactor-stock-fell-15...

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  9. EPIC (form factor) - Wikipedia

    en.wikipedia.org/wiki/EPIC_(form_factor)

    The EPIC standard was developed by a combined effort from WinSystems, VersaLogic, Octagon Systems, Micro/sys, and Ampro.Single board computers using this standard were available as early as 2004. [1]