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  2. Electron mobility - Wikipedia

    en.wikipedia.org/wiki/Electron_mobility

    However, mobility is much more commonly expressed in cm 2 /(V⋅s) = 10 −4 m 2 /(V⋅s). Mobility is usually a strong function of material impurities and temperature, and is determined empirically. Mobility values are typically presented in table or chart form. Mobility is also different for electrons and holes in a given material.

  3. Carrier lifetime - Wikipedia

    en.wikipedia.org/wiki/Carrier_Lifetime

    In semiconductor lasers, the carrier lifetime is the time it takes an electron before recombining via non-radiative processes in the laser cavity. In the frame of the rate equations model , carrier lifetime is used in the charge conservation equation as the time constant of the exponential decay of carriers.

  4. Mott–Schottky plot - Wikipedia

    en.wikipedia.org/wiki/Mott–Schottky_plot

    Mott–Schottky plot of a fluorine-doped tin oxide (FTO) semiconductor electrode measured in aqueous electrolyte at different pH, with respect to standard Ag/AgCl electrode. Changing the pH modifies the apparent flatband potential by 570 mV corresponding to a 59 mV displacement per unit of pH.

  5. Semiconductor characterization techniques - Wikipedia

    en.wikipedia.org/wiki/Semiconductor...

    Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.

  6. High-electron-mobility transistor - Wikipedia

    en.wikipedia.org/wiki/High-electron-mobility...

    The invention of the high-electron-mobility transistor (HEMT) is usually attributed to physicist Takashi Mimura (三村 高志), while working at Fujitsu in Japan. [4] The basis for the HEMT was the GaAs (gallium arsenide) MOSFET (metal–oxide–semiconductor field-effect transistor), which Mimura had been researching as an alternative to the standard silicon (Si) MOSFET since 1977.

  7. Diffusion current - Wikipedia

    en.wikipedia.org/wiki/Diffusion_current

    Diffusion current is a current in a semiconductor caused by the diffusion of charge carriers (electrons and/or electron holes).This is the current which is due to the transport of charges occurring because of non-uniform concentration of charged particles in a semiconductor.

  8. Charge carrier density - Wikipedia

    en.wikipedia.org/wiki/Charge_carrier_density

    The carrier density is important for semiconductors, where it is an important quantity for the process of chemical doping.Using band theory, the electron density, is number of electrons per unit volume in the conduction band.

  9. Saturation velocity - Wikipedia

    en.wikipedia.org/wiki/Saturation_velocity

    The proportionality constant is known as mobility of the carrier, which is a material property. A good conductor would have a high mobility value for its charge carrier, which means higher velocity, and consequently higher current values for a given electric field strength. There is a limit though to this process and at some high field value, a ...