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X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Early X-ray microscopes by Paul Kirkpatrick and Albert Baez used grazing-incidence reflective X-ray optics to focus the X-rays, which grazed X-rays off parabolic curved mirrors at a very high angle of incidence. An alternative method of focusing X-rays is to use a tiny Fresnel zone plate of concentric gold or nickel rings on a silicon dioxide ...
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The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
Also similar is reflection high-energy electron diffraction which typically leads to rings of diffraction spots. [18] With X-rays the effect of having small crystals is described by the Scherrer equation. [13] [19] [20] This leads to broadening of the Bragg peaks which can be used to estimate the size of the crystals.
The wave fields traditionally described are X-rays, neutrons or electrons and the regular lattice are atomic crystal structures or nanometer-scale multi-layers or self-arranged systems. In a wider sense, similar treatment is related to the interaction of light with optical band-gap materials or related wave problems in acoustics .
Usually X-ray diffraction in spectrometers is achieved on crystals, but in Grating spectrometers, the X-rays emerging from a sample must pass a source-defining slit, then optical elements (mirrors and/or gratings) disperse them by diffraction according to their wavelength and, finally, a detector is placed at their focal points.