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An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
The grade (US) or gradient (UK) (also called stepth, slope, incline, mainfall, pitch or rise) of a physical feature, landform or constructed line refers to the tangent of the angle of that surface to the horizontal. It is a special case of the slope, where zero indicates horizontality. A larger number indicates higher or steeper degree of "tilt".
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
Nevertheless, powder X-ray diffraction is a powerful and useful technique in its own right. It is mostly used to characterize and identify phases, and to refine details of an already known structure, rather than solving unknown structures. Advantages of the technique are: simplicity of sample preparation; rapidity of measurement
Usually X-ray diffraction in spectrometers is achieved on crystals, but in Grating spectrometers, the X-rays emerging from a sample must pass a source-defining slit, then optical elements (mirrors and/or gratings) disperse them by diffraction according to their wavelength and, finally, a detector is placed at their focal points.
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource