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2. Electrostatic force microscope - Wikipedia

   en.wikipedia.org/wiki/Electrostatic_force_microscope

   Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges.

3. Kelvin probe force microscope - Wikipedia

   en.wikipedia.org/wiki/Kelvin_probe_force_microscope

   A related technique, electrostatic force microscopy (EFM), directly measures the force produced on a charged tip by the electric field emanating from the surface. EFM operates much like magnetic force microscopy in that the frequency shift or amplitude change of the cantilever oscillation is used to detect the electric field. However, EFM is ...

4. Force spectroscopy - Wikipedia

   en.wikipedia.org/wiki/Force_spectroscopy

   The so-called force curve is the graph of force (or more precisely, of cantilever deflection) versus the piezoelectric position on the Z axis. An ideal Hookean spring, for example, would display a straight diagonal force curve. Typically, the force curves observed in the force spectroscopy experiments consist of a contact (diagonal) region ...

5. Piezoresponse force microscopy - Wikipedia

   en.wikipedia.org/wiki/Piezoresponse_force_microscopy

   Piezoresponse force microscopy is a technique which since its inception and first implementation by Güthner and Dransfeld [1] has steadily attracted more and more interest. This is due in large part to the many benefits and few drawbacks that PFM offers researchers in varying fields from ferroelectrics, semiconductors and even biology. [ 2 ]

6. Non-contact atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Non-contact_atomic_force...

   Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

7. Photoconductive atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Photoconductive_Atomic...

   Electrostatic force microscopy (EFM) and scanning Kelvin probe microscopy (SKPM) have been utilized in the studies of electron injection and charge trapping effects, while scanning tunneling microscopy (STM) and conductive atomic force microscopy (c-AFM) have been used to investigate electron transport properties within these organic ...

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9. Atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Atomic_force_microscopy

   An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...