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Reliability of semiconductors is kept high through several methods. Cleanrooms control impurities, process control controls processing, and burn-in (short term operation at extremes) and probe and test reduce escapes. Probe (wafer prober) tests the semiconductor die, prior to packaging, via micro-probes connected to test equipment.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
Software reliability testing is being used as a tool to help assess these software engineering technologies. [9] To improve the performance of software product and software development process, a thorough assessment of reliability is required. Testing software reliability is important because it is of great use for software managers and ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
HALT is a test technique called test-to-fail, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are test-to-pass, meaning they are used to demonstrate the product life or reliability.
ExhaustiF is a commercial software tool used for grey box testing based on software fault injection (SWIFI) to improve reliability of software-intensive systems. The tool can be used during system integration and system testing phases of any software development lifecycle, complementing other testing tools as well.
Semiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components (resistors, capacitors, and inductors) to integrated circuits (ICs), printed circuit boards (PCBs), and complex, completely assembled electronic systems.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.