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  2. These Student-Friendly Microscopes Are Our Top Picks ... - AOL

    www.aol.com/editor-approved-microscopes-top...

    Compound Microscope. This beginner compound microscope has an impressive lineup of features found in models with a higher price point, including six magnification levels up to 1,000 times, three ...

  3. Foldscope - Wikipedia

    en.wikipedia.org/wiki/Foldscope

    The Gordon and Betty Moore Foundation funded the "Ten Thousand Microscopes" project under which Prakash plans to give away 10,000 Foldscope kits to interested parties, including students for research. [5] [7] [8] The projects eventually expanded to 50,000 Foldscope kits. Those who received the kits were encouraged to share their experiences ...

  4. Edmund Scientific Corporation - Wikipedia

    en.wikipedia.org/wiki/Edmund_Scientific_Corporation

    Edmund Scientific Corporation, based in Barrington, New Jersey, was founded in 1942 as a retailer of surplus optical parts like lenses.It later branched out into complete systems like telescopes and microscopes, and in the 1960s, a wide variety of science toys and kits.

  5. J & L Randall - Wikipedia

    en.wikipedia.org/wiki/J_&_L_Randall

    The company made a wide range of toys under both brand names. The catalogue [3] contained hundreds of items at their peak. Nowadays, they are best known for the SEL range, especially the steam engines, dynamotor and student's microscopes.

  6. Unitron - Wikipedia

    en.wikipedia.org/wiki/Unitron

    Unitron is a US-based company and distributor of optical instruments including stereo microscopes and accessories, binoculars, and classic brass telescopes. The company was founded in 1952 by Lawrence A. Fine as the United Trading Company and located in Boston, MA. [1]

  7. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    The Kelvin probe force microscope or Kelvin force microscope (KFM) is based on an AFM set-up and the determination of the work function is based on the measurement of the electrostatic forces between the small AFM tip and the sample.

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