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The model is a simulation of the discharge which might occur when a human touches an electronic device. The HBM definition most widely used is the test model defined in the United States military standard, MIL-STD-883, Method 3015.9, Electrostatic Discharge Sensitivity Classification.
The charged-device model (CDM) is a model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is an alternative to the human-body model (HBM). Devices that are classified according to CDM are exposed to a charge at a standardized voltage level, and then tested for survival.
A charged device model (CDM) test is used to define the ESD a device can withstand when the device itself has an electrostatic charge and discharges due to metal contact. This discharge type is the most common type of ESD in electronic devices and causes most of the ESD damages in their manufacturing.
An electrostatic-sensitive device (often abbreviated ESD) is any component (primarily electrical) which can be damaged by common static charges which build up on people, tools, and other non-conductors or semiconductors. [1] ESD commonly also stands for electrostatic discharge.
Electrostatic discharge (ESD) is a subclass of electrical overstress and may cause immediate device failure, permanent parameter shifts and latent damage causing increased degradation rate. It has at least one of three components, localized heat generation, high current density and high electric field gradient; prolonged presence of currents of ...
IEC 61000-4-2 is the International Electrotechnical Commission's immunity standard on electrostatic discharge (ESD). The publication is one of the basic EMC standards of the IEC 61000–4 series. The publication is one of the basic EMC standards of the IEC 61000–4 series.
An antistatic device is any device that reduces, dampens, or otherwise inhibits electrostatic discharge, or ESD, which is the buildup or discharge of static electricity. [ 1 ] [ 2 ] ESD can damage electrical components such as computer hard drives, and even ignite flammable liquids and gases.
In electrical engineering, transmission-line pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 of Pulse Generators , Vol. 5 of the MIT Radiation Lab Series.