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  2. Surface roughness - Wikipedia

    en.wikipedia.org/wiki/Surface_roughness

    Surface roughness can be regarded as the quality of a surface of not being smooth and it is hence linked to human perception of the surface texture. From a mathematical perspective it is related to the spatial variability structure of surfaces, and inherently it is a multiscale property.

  3. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision ...

  4. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography.

  5. Surface finish - Wikipedia

    en.wikipedia.org/wiki/Surface_finish

    Surface roughness, commonly shortened to roughness, is a measure of the total spaced surface irregularities. [1] In engineering, this is what is usually meant by "surface finish." A Lower number constitutes finer irregularities, i.e., a smoother surface.

  6. ISO 16610 - Wikipedia

    en.wikipedia.org/wiki/ISO_16610

    ISO 16610: Geometrical product specifications (GPS) – Filtration is a standard series on filters for surface texture, and provides guidance on the use of these filters in various applications. Filters are used in surface texture in order reduce the bandwidth of analysis in order to obtain functional correlation with physical phenomena such as ...

  7. ISO 25178 - Wikipedia

    en.wikipedia.org/wiki/ISO_25178

    Under 25178, industry-specific taxonomies such as roughness vs waviness are replaced by the more general concept of "scale limited surface" and "cut-off" by "nesting index". The new available filters are described in the series of technical specifications included in ISO 16610 .

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