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Populated (rear) and unpopulated (front) TSOP land patterns on a printed circuit board. A row of through-holes acting as the footprint for a pin header.. A footprint or land pattern is the arrangement of pads (in surface-mount technology) [1] or through-holes (in through-hole technology) used to physically attach and electrically connect a component to a printed circuit board.
Grain size (or particle size) is the diameter of individual grains of sediment, or the lithified particles in clastic rocks. The term may also be applied to other granular materials . This is different from the crystallite size, which refers to the size of a single crystal inside a particle or grain.
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Made in Japan, this was also the first calculator to use an LED display, the first hand-held calculator to use a single integrated circuit (then proclaimed as a "calculator on a chip"), the Mostek MK6010, and the first electronic calculator to run off replaceable batteries. Using four AA-size cells the LE-120A measures 4.9 by 2.8 by 0.9 inches ...
Particle size is a notion introduced for comparing dimensions of solid particles , liquid particles , or gaseous particles . The notion of particle size applies to particles in colloids , in ecology , in granular material (whether airborne or not), and to particles that form a granular material (see also grain size ).
Grain Cube (or Grain Capacity) – The maximum space available for cargo measured in cubic metres or feet, the measurement being taken to the inside of the shell plating of the ship or to the outside of the frames and to the top of the beam or underside of the deck plating. It is a measurement of capacity for cargoes such as grain, where the ...
The Tegra APX 2500 was announced on February 12, 2008. The Tegra 6xx product line was revealed on June 2, 2008, [1] and the APX 2600 was announced in February 2009. The APX chips were designed for smartphones, while the Tegra 600 and 650 chips were intended for smartbooks and mobile Internet devices (MID).
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.