Search results
Results from the WOW.Com Content Network
The following other wikis use this file: Usage on bn.wikipedia.org আলোকরশ্মি; Usage on bn.wikibooks.org উইকিশৈশব:ইংরেজি বর্ণমালায় বিজ্ঞান/R
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
Conventional telescope designs require reflection or refraction in a manner that does not work well for X-rays. Visible light optical systems use either lenses or mirrors aligned for nearly normal incidence – that is, the light waves travel nearly perpendicular to the reflecting or refracting surface.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
An X-ray microscopy image of a living 10-days-old canola plant [1]. An X-ray microscope uses electromagnetic radiation in the X-ray band to produce magnified images of objects. . Since X-rays penetrate most objects, there is no need to specially prepare them for X-ray microscopy observatio
In optics, one usually knows the refractive index n of the medium, which is the ratio of the speed of light in vacuum (c) to the speed of light in the medium. In the analysis of partial reflection and transmission, one is also interested in the electromagnetic wave impedance Z, which is the ratio of the amplitude of E to the amplitude of H.
X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [ 6 ] [ 7 ] [ 8 ] Grazing incidence atom scattering, [ 9 ] [ 10 ] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.