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Memorial in Jena, Germany to Ernst Karl Abbe, who approximated the diffraction limit of a microscope as = , where d is the resolvable feature size, λ is the wavelength of light, n is the index of refraction of the medium being imaged in, and θ (depicted as α in the inscription) is the half-angle subtended by the optical objective lens (representing the numerical aperture).
[clarification needed] We determine the size of this area by the diffraction-limited resolution of the lens which is given by the Airy disk whose diameter is 2.4λu/D, where λ is the wavelength of the light, u is the distance between the object and the lens, and D is the diameter of the lens aperture. (This is a simplified model of diffraction ...
The size of the pointlike vacancies, corresponding to the microscope's resolution, is about 15 nm. Ground state depletion microscopy ( GSD microscopy ) is an implementation of the RESOLFT concept. The method was proposed in 1995 [ 1 ] and experimentally demonstrated in 2007. [ 2 ]
The ability of a lens to resolve detail is usually determined by the quality of the lens, but is ultimately limited by diffraction.Light coming from a point source in the object diffracts through the lens aperture such that it forms a diffraction pattern in the image, which has a central spot and surrounding bright rings, separated by dark nulls; this pattern is known as an Airy pattern, and ...
The conventional diffraction-limited resolution is given by the Rayleigh criterion as /, where is the numerical aperture and is the wavelength of the illumination source. It is often common to compare the critical feature width to this value, by defining a parameter, k 1 , {\displaystyle k_{1},} such that feature width equals k 1 λ / N A ...
Because diffraction is the result of addition of all waves (of given wavelength) along all unobstructed paths, the usual procedure is to consider the contribution of an infinitesimally small neighborhood around a certain path (this contribution is usually called a wavelet) and then integrate over all paths (= add all wavelets) from the source to the detector (or given point on a screen).
High-resolution electron microscope images can be transformed into an artificial diffraction pattern using Fourier transform. Then, they can be processed the same way as real diffractograms allowing to determine crystal orientation, measure interplanar angles and distances even with picometric precision.
At the same time as approaches to invert diffraction data using electrons were established, the resolution of electron microscopes became good enough that images could be combined with diffraction information. At first resolution was poor, with in 1956 James Menter publishing the first electron microscope images showing the lattice structure of ...