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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
motofit is a program for analysing neutron and X-ray reflectometry data. OpenFilters is a program for designing optical filters. Py_matrix is an open source Python code that implements the transfer-matrix method for multilayers with arbitrary dielectric tensors. It was especially created for plasmonic and magnetoplasmonic calculations.
Reflectivity of X-rays is low, regardless of the used material and therefore, grazing incidence upon the grating is necessary. X-ray beams impinging on a smooth surface at a few degrees glancing angle of incidence undergo external total reflection which is taken advantage of to enhance the instrumental efficiency substantially.
X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [ 6 ] [ 7 ] [ 8 ] Grazing incidence atom scattering, [ 9 ] [ 10 ] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.
The measurement of the angles can be used to determine crystal structure, see x-ray crystallography for more details. [ 5 ] [ 13 ] As a simple example, Bragg's law, as stated above, can be used to obtain the lattice spacing of a particular cubic system through the following relation:
Anomalous X-ray scattering (MAD or SAD phasing) – the X-ray wavelength may be scanned past an absorption edge [a] of an atom, which changes the scattering in a known way. By recording full sets of reflections at three different wavelengths (far below, far above and in the middle of the absorption edge) one can solve for the substructure of ...