Search results
Results from the WOW.Com Content Network
Here, λ 0 is the wavelength in vacuum; NA is the numerical aperture for the optical component (maximum 1.3–1.4 for modern objectives with a very high magnification factor). Thus, the resolution limit is usually around λ 0 /2 for conventional optical microscopy. [17]
In terms of imaging, SHIM has several advantages over the traditional scanning electron microscope (SEM). Owing to the very high source brightness, and the short De Broglie wavelength of the helium ions, which is inversely proportional to their momentum, it is possible to obtain qualitative data not achievable with conventional microscopes ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...
English: Scanning electron microscopes are capable of an extremely wide range of magnifications hard to visualise with a simple image, instead this video shows a zoom in from a typical low magnification to a high magnification. It starts at 25x, about 6 mm across the whole field of view, and zooms in to 12000x, about 12 μm across the whole ...
The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...
For a high numerical aperture lens, equivalent to a wide aperture, the depth of field is small (shallow focus) and gives good optical sectioning. High magnification objective lenses typically have higher numerical apertures (and so better optical sectioning) than low magnification objectives.