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  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    This is useful if the sample is too thick for X-rays to transmit through it. The diffracting planes in the crystal are determined by knowing that the normal to the diffracting plane bisects the angle between the incident beam and the diffracted beam. A Greninger chart can be used [30] to interpret the back reflection Laue photograph.

  3. Wyckoff positions - Wikipedia

    en.wikipedia.org/wiki/Wyckoff_positions

    The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  5. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  6. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. [1] which assumes that the acquired data are powder diffraction data. For this reason, it has also been mentioned as powder diffraction computed tomography [ 7 ] and diffraction scattering computed tomography (DSCT ...

  7. Energy-dispersive X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Energy-dispersive_X-ray...

    A detector is used to convert X-ray energy into voltage signals; this information is sent to a pulse processor, which measures the signals and passes them onto an analyzer for data display and analysis. [citation needed] The most common detector used to be a Si(Li) detector cooled to cryogenic temperatures with liquid nitrogen.

  8. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects. In 2020, the ICDD and the Cambridge Crystallographic Data Centre, which curates and maintains the Cambridge Structural Database, announced a data partnership.

  9. Illite crystallinity - Wikipedia

    en.wikipedia.org/wiki/Illite_crystallinity

    The focus of an illite crystallinity XRD plot is the main peak. Width of the peak at one half of its height is measured and this angle (recorded with units of ∆ °2θ), [1] can be plotted on a chart with metamorphic zones and facies like the one in figure 1. If the illite crystallinity values fall in the 0-0.25 °2θ range, it corresponds ...