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  2. Contamination delay - Wikipedia

    en.wikipedia.org/wiki/Contamination_delay

    The circuit is guaranteed not to show any output change in response to an input change before t cd time units (calculated for the whole circuit) have passed. The determination of the contamination delay of a combined circuit requires identifying the shortest path of contamination delays from input to output and by adding each t cd time along ...

  3. Multiple sequence alignment - Wikipedia

    en.wikipedia.org/wiki/Multiple_sequence_alignment

    Typical HMM-based methods work by representing an MSA as a form of directed acyclic graph known as a partial-order graph, which consists of a series of nodes representing possible entries in the columns of an MSA. In this representation a column that is absolutely conserved (that is, that all the sequences in the MSA share a particular ...

  4. MAFFT - Wikipedia

    en.wikipedia.org/wiki/MAFFT

    In bioinformatics, MAFFT (multiple alignment using fast Fourier transform) is a program used to create multiple sequence alignments of amino acid or nucleotide sequences. . Published in 2002, the first version used an algorithm based on progressive alignment, in which the sequences were clustered with the help of the fast Fourier transfo

  5. Monolithic microwave integrated circuit - Wikipedia

    en.wikipedia.org/wiki/Monolithic_microwave...

    This makes them easier to use, as cascading of MMICs does not then require an external matching network. Additionally, most microwave test equipment is designed to operate in a 50-ohm environment. Additionally, most microwave test equipment is designed to operate in a 50-ohm environment.

  6. Race condition - Wikipedia

    en.wikipedia.org/wiki/Race_condition

    A critical race condition occurs when the order in which internal variables are changed determines the eventual state that the state machine will end up in. . A non-critical race condition occurs when the order in which internal variables are changed does not determine the eventual state that the state machine will end up in.

  7. Audio system measurements - Wikipedia

    en.wikipedia.org/wiki/Audio_system_measurements

    This does not imply that the defect is somehow unquantifiable or unmeasurable; just that a single THD number is inadequate to specify it and must be interpreted with care. Taking THD measurements at different output levels would expose whether the distortion is clipping (which increases with level) or crossover (which decreases with level).

  8. Moisture sensitivity level - Wikipedia

    en.wikipedia.org/wiki/Moisture_sensitivity_level

    It relates to the packaging and handling precautions for some semiconductors. The MSL is an electronic standard for the time period in which a moisture sensitive device can be exposed to ambient room conditions (30 °C/85%RH at Level 1; 30 °C/60%RH at all other levels). Increasingly, semiconductors have been manufactured in smaller sizes.

  9. Control loop - Wikipedia

    en.wikipedia.org/wiki/Control_loop

    A control loop is the fundamental building block of control systems in general and industrial control systems in particular. It consists of the process sensor, the controller function, and the final control element (FCE) which controls the process necessary to automatically adjust the value of a measured process variable (PV) to equal the value of a desired set-point (SP).