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Electrowetting using an insulating layer on top of a bare electrode was later studied by Bruno Berge in 1993. [6] Electrowetting on this dielectric-coated surface is called electrowetting-on-dielectric (EWOD) [7] to distinguish it from the conventional electrowetting on the
In electrical engineering, a dielectric withstand test (also pressure test, high potential test, hipot test, or insulation test) is an electrical safety test performed on a component or product to determine the effectiveness of its insulation. The test may be between mutually insulated sections of a part, or energized parts and ground.
A dielectric voltage withstand test (also known as a hipot test) is done by applying a voltage higher than operating voltage to the device or installation under test. In this test, the electric insulation of a product or installation is put under a voltage stress much higher than its normal operating voltage.
Using this device, material parameters such as permittivity, doping, oxide charge, and dielectric strength may be evaluated. The contact area of a mercury droplet resting on a semiconductor can be modified by electrowetting, [4] meaning that accurate parameter extraction may need to take this effect into account.
Optoelectrowetting (OEW) is a method of liquid droplet manipulation used in microfluidics applications. This technique builds on the principle of electrowetting, which has proven useful in liquid actuation due to fast switching response times and low power consumption.
One common actuation method for digital microfluidics is electrowetting-on-dielectric . [43] Many lab-on-a-chip applications have been demonstrated within the digital microfluidics paradigm using electrowetting.
Replacing the conductor with a semiconductor results in asymmetrical electrowetting behavior (in terms of voltage polarity), depending on the semiconductor doping type and density. Incident light above the semiconductor's band gap creates photo-induced carriers via electron-hole pair generation in the depletion region of the underlying ...
Dielectric thermal analysis (DETA), or dielectric analysis (DEA), is a materials science technique similar to dynamic mechanical analysis except that an oscillating electrical field is used instead of a mechanical force. [1]