Search results
Results from the WOW.Com Content Network
A simple SCR circuit with a resistive load. A simple SCR circuit can be illustrated using an AC voltage source connected to a SCR with a resistive load. Without an applied current pulse to the gate of the SCR, the SCR is left in its forward blocking state. This makes the start of conduction of the SCR controllable.
low SCR: in case of a short circuit, the current is proportional to SCR, therefore generators with low SCR require less protection and thus are cheaper; low SCR allows shorter air gap and lower excitation field, both decreasing the size (an cost) of the generator; with low SCR the amounts of iron and copper are reduced, lowering the cost; high SCR:
A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).
The SCR can be calculated for each point on an electrical grid. A point on a grid having a number of machines with an SCR above a number between 1 and 1.5 has less vulnerability to voltage instability. Hence, such a grid is known strong grid or power system. A power system (grid) having a lower SCR has more vulnerability to grid voltage ...
It is known as a current-limiting diode (CLD) or current-regulating diode (CRD). Internal structure. It consists of an n-channel JFET with the gate shorted to the source, which functions like a two-terminal current limiter (analogous to a voltage-limiting Zener diode). It allows a current through it to rise to a certain value, but not higher.
Separable assembly or sub-assembly (e.g. printed circuit assembly) AT: Attenuator or isolator: BR: Bridge rectifier (four diodes in a package) often changed to "D" for diode BT, BAT: Battery or battery holder: often shortened to "B" C: Capacitor: CB: Circuit breaker: CN: Capacitor network: may be simplified to "C" for capacitor D, CR: Diode ...
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values). The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.
It is possible to modify a regular semiconductor diode like 1N4148 to give it a negative differential resistance by injection of calibrated current pulses ,the diode being reversely biased near its avalanche zone .After this treatment the diode associated with an L/C circuit can oscillate , the frequency set by the L/C circuit .The maximum ...