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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
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X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring.
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motofit is a program for analysing neutron and X-ray reflectometry data. OpenFilters is a program for designing optical filters. Py_matrix is an open source Python code that implements the transfer-matrix method for multilayers with arbitrary dielectric tensors. It was especially created for plasmonic and magnetoplasmonic calculations.
The X-ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s, [1] the availability of synchrotron light has stimulated the application of this interferometric technique to a wide range of problems in surface science.
Reflectivity of X-rays is low, regardless of the used material and therefore, grazing incidence upon the grating is necessary. X-ray beams impinging on a smooth surface at a few degrees glancing angle of incidence undergo external total reflection which is taken advantage of to enhance the instrumental efficiency substantially.