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Darlington Transistor (NPN-type) In electronics, a Darlington configuration (commonly called as a Darlington pair) is a circuit consisting of two bipolar transistors with the emitter of one transistor connected to the base of the other, such that the current amplified by the first transistor is amplified further by the second one. [1]
Early, is the variation in the effective width of the base in a bipolar junction transistor (BJT) due to a variation in the applied base-to-collector voltage. A greater reverse bias across the collector–base junction, for example, increases the collector–base depletion width, thereby decreasing the width of the charge carrier portion of the ...
Figure 1: Basic NPN common collector circuit (neglecting biasing details). In electronics, a common collector amplifier (also known as an emitter follower) is one of three basic single-stage bipolar junction transistor (BJT) amplifier topologies, typically used as a voltage buffer.
In this phenomenon, when the base of an NPN transistor is turned on, enough current flows through the emitter-collector circuit that the silicon in the immediate vicinity of the emitter-ground connection is pulled partially high, sometimes by several volts, thus raising the local ground, as perceived at the gate, to a value significantly above ...
Figure 1: Basic NPN common base circuit (neglecting biasing details). In electronics, a common-base (also known as grounded-base) amplifier is one of three basic single-stage bipolar junction transistor (BJT) amplifier topologies, typically used as a current buffer or voltage amplifier.
For NPN open collector outputs, the emitter of the NPN transistor is internally connected to ground, [1] so the NPN open collector internally forms either a short-circuit (technically low impedance or "low-Z") connection to the low voltage (which could be ground) when the transistor is switched on, or an open-circuit (technically high impedance ...
This is caused by current crowding during the snapback of the parasitic NPN transistor. [18] In P/NMOS totem-pole structures, the NMOS transistor is almost always the one damaged. [19] The structure of the junction influences its ESD sensitivity; corners and defects can lead to current crowding, reducing the damage threshold.